Estimation and Testing Procedures for the Reliability Characteristics of Chen Distribution Based on Type II Censoring and the Sampling Scheme of Bartholomew
{"title":"Estimation and Testing Procedures for the Reliability Characteristics of Chen Distribution Based on Type II Censoring and the Sampling Scheme of Bartholomew","authors":"A. Chaturvedi, Surinder Kumar","doi":"10.19139/SOIC-2310-5070-1032","DOIUrl":null,"url":null,"abstract":"In this paper, we consider Chen distribution and derive UMVUEs and MLEs of the parameter λ, hazard rate h(t) and the two measures of reliability, namely R(t) = P (X > t), where X denotes the lifetime of an item and P = P (X > Y ), which represents the reliability of an item or system of random strength X subject to random stress Y , under type II censoring scheme and the sampling scheme of Bartholomew. We also develop interval estimates of the reliability measures. Testing procedures for the hypotheses related to different parametric functions have also been developed. A comparative study of different methods of point estimation and average confiddence length has been done through simulation studies. The analysis of a real data set is presented for illustration purpose.","PeriodicalId":93376,"journal":{"name":"Statistics, optimization & information computing","volume":"9 1","pages":"99-122"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Statistics, optimization & information computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.19139/SOIC-2310-5070-1032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this paper, we consider Chen distribution and derive UMVUEs and MLEs of the parameter λ, hazard rate h(t) and the two measures of reliability, namely R(t) = P (X > t), where X denotes the lifetime of an item and P = P (X > Y ), which represents the reliability of an item or system of random strength X subject to random stress Y , under type II censoring scheme and the sampling scheme of Bartholomew. We also develop interval estimates of the reliability measures. Testing procedures for the hypotheses related to different parametric functions have also been developed. A comparative study of different methods of point estimation and average confiddence length has been done through simulation studies. The analysis of a real data set is presented for illustration purpose.