{"title":"A new Spk -based sample-size tightening sampling system for lot determination","authors":"Shih-Wen Liu, Zih-Huei Wang","doi":"10.1080/16843703.2021.2021617","DOIUrl":null,"url":null,"abstract":"ABSTRACT This article presents a new Spk-based sample-size tightening sampling system by variables inspection for lot determination when the quality characteristic has bilateral specification limits. The proposed system has a flexible switching mechanism between normal and tightened inspection, which is adaptively employed for the occurrence of quality deterioration in submitted lots. The performances of discriminatory power, economy and sensitivity to quality shift of the proposed method are demonstrated by comparing the operating characteristic (OC) curve, average sample number (ASN) and average run length (ARL), respectively, with the existing sampling plans. Furthermore, for practical application, the solved plan parameters under certain quality conditions are tabulated for quick reference, and an example taken from the Multi-layer Ceramic Capacitor (MLCC) industry is studied for illustration.","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":null,"pages":null},"PeriodicalIF":2.3000,"publicationDate":"2023-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quality Technology and Quantitative Management","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1080/16843703.2021.2021617","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}
引用次数: 1
Abstract
ABSTRACT This article presents a new Spk-based sample-size tightening sampling system by variables inspection for lot determination when the quality characteristic has bilateral specification limits. The proposed system has a flexible switching mechanism between normal and tightened inspection, which is adaptively employed for the occurrence of quality deterioration in submitted lots. The performances of discriminatory power, economy and sensitivity to quality shift of the proposed method are demonstrated by comparing the operating characteristic (OC) curve, average sample number (ASN) and average run length (ARL), respectively, with the existing sampling plans. Furthermore, for practical application, the solved plan parameters under certain quality conditions are tabulated for quick reference, and an example taken from the Multi-layer Ceramic Capacitor (MLCC) industry is studied for illustration.
期刊介绍：
Quality Technology and Quantitative Management is an international refereed journal publishing original work in quality, reliability, queuing service systems, applied statistics (including methodology, data analysis, simulation), and their applications in business and industrial management. The journal publishes both theoretical and applied research articles using statistical methods or presenting new results, which solve or have the potential to solve real-world management problems.
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