Vibration Measurements by Self-Mixing Interferometry: An Overview of Configurations and Benchmark Performances

IF 1.9 Q3 ENGINEERING, MECHANICAL Vibration Pub Date : 2023-08-02 DOI:10.3390/vibration6030039
S. Donati
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Abstract

Self-mixing interferometry (SMI) is suitable to sense and measure vibrations of amplitudes ranging from picometers to millimeters at frequencies from sub-Hz to MHz’s. As an optical probe, SMI has the advantage of being non-invasive with the ability to measure without any treatment of the target surface and operate from a substantial standoff distance from the target. As an additional advantage, the SMI configuration is much simpler than that of conventional interferometers as it does not require any optical part external to the laser source. After a short introduction to the basics of SMI, we review the development of configurations of SMI instruments for vibration measurements, based on both analog and digital processing, with record performance to cover the range of vibration amplitudes from 0.1 nm to 1 mm, frequencies up to MHz, and stand-off distances up to 100 m. These performances set a benchmark that is unequaled by other approaches reported so far in the literature. The configurations we describe are (i) a simple MEMS-response testing instrument based on fringe counting, (ii) a half-fringe locking vibrometer for mechanical mode analysis and transfer function measurements, with a wide linear response on six decades of amplitude, (iii) a vibrometer with analog switching cancellation for μm-to-mm amplitude of vibrations, and (iv) a long standoff distance vibrometer for testing large structures at distances up to 100 m and with nm sensitivity. Lastly, as the vibrometer will almost invariably operate on untreated, diffusing surfaces, we provide an evaluation of phase-induced speckle pattern errors affecting the SMI measurement.
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自混合干涉振动测量:配置和基准性能概述
自混合干涉测量法(SMI)适用于感测和测量振幅从皮米到毫米、频率从亚赫兹到兆赫的振动。作为一种光学探针,SMI具有非侵入性的优点,能够在不对目标表面进行任何处理的情况下进行测量,并在距离目标相当远的距离处进行操作。作为附加优点,SMI配置比传统干涉仪的配置简单得多,因为它不需要激光源外部的任何光学部件。在简要介绍了SMI的基础知识后,我们回顾了基于模拟和数字处理的SMI振动测量仪器配置的发展,其记录性能涵盖了0.1 nm至1 mm的振幅范围、高达MHz的频率和高达100 m的间隔距离。这些性能树立了迄今为止文献中报道的其他方法所无法比拟的基准。我们描述的配置是(i)一种基于条纹计数的简单MEMS响应测试仪器,(ii)一种用于机械模式分析和传递函数测量的半条纹锁定振动计,在60年的振幅上具有宽的线性响应,(iii)一种具有模拟开关消除的振动计,用于μm-mm振幅的振动,和(iv)用于在高达100m的距离和nm灵敏度下测试大型结构的长距离振动计。最后,由于振动计几乎总是在未经处理的散射表面上工作,我们对影响SMI测量的相位诱导散斑图案误差进行了评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
3.20
自引率
0.00%
发文量
0
审稿时长
10 weeks
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