{"title":"Reliability analyses of linear two-dimensional consecutive k-type systems","authors":"He Yi, N. Balakrishnan, Xiang Li","doi":"10.1017/jpr.2023.51","DOIUrl":null,"url":null,"abstract":"\n In this paper, several linear two-dimensional consecutive k-type systems are studied, which include the linear connected-(k, r)-out-of-\n \n \n \n$(m,n)\\colon\\! F$\n\n \n system and the linear l-connected-(k, r)-out-of-\n \n \n \n$(m,n)\\colon\\! F$\n\n \n system without/with overlapping. Reliabilities of these systems are studied via the finite Markov chain imbedding approach (FMCIA) in a novel way. Some numerical examples are provided to illustrate the theoretical results established here and also to demonstrate the efficiency of the developed method. Finally, some possible applications and generalizations of the developed results are pointed out.","PeriodicalId":50256,"journal":{"name":"Journal of Applied Probability","volume":null,"pages":null},"PeriodicalIF":0.7000,"publicationDate":"2023-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Probability","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1017/jpr.2023.51","RegionNum":4,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"STATISTICS & PROBABILITY","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, several linear two-dimensional consecutive k-type systems are studied, which include the linear connected-(k, r)-out-of-
$(m,n)\colon\! F$
system and the linear l-connected-(k, r)-out-of-
$(m,n)\colon\! F$
system without/with overlapping. Reliabilities of these systems are studied via the finite Markov chain imbedding approach (FMCIA) in a novel way. Some numerical examples are provided to illustrate the theoretical results established here and also to demonstrate the efficiency of the developed method. Finally, some possible applications and generalizations of the developed results are pointed out.
期刊介绍：
Journal of Applied Probability is the oldest journal devoted to the publication of research in the field of applied probability. It is an international journal published by the Applied Probability Trust, and it serves as a companion publication to the Advances in Applied Probability. Its wide audience includes leading researchers across the entire spectrum of applied probability, including biosciences applications, operations research, telecommunications, computer science, engineering, epidemiology, financial mathematics, the physical and social sciences, and any field where stochastic modeling is used.
A submission to Applied Probability represents a submission that may, at the Editor-in-Chief’s discretion, appear in either the Journal of Applied Probability or the Advances in Applied Probability. Typically, shorter papers appear in the Journal, with longer contributions appearing in the Advances.
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