Bi-level feature selection in high dimensional AFT models with applications to a genomic study

Abstract

Abstract We propose a new bi-level feature selection method for high dimensional accelerated failure time models by formulating the models to a single index model. The method yields sparse solutions at both the group and individual feature levels along with an expedient algorithm, which is computationally efficient and easily implemented. We analyze a genomic dataset for an illustration, and present a simulation study to show the finite sample performance of the proposed method.