{"title":"Test Technology TC Newsletter","authors":"Theo Charides","doi":"10.1109/MDAT.2017.2730838","DOIUrl":null,"url":null,"abstract":"TTTC News The TTTC website always lists the latest features and information for its visitors! To find out more, please visit the website at http://www.ieee-tttc.org/ .","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":"34 1","pages":"101-102"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDAT.2017.2730838","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDAT.2017.2730838","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
TTTC News The TTTC website always lists the latest features and information for its visitors! To find out more, please visit the website at http://www.ieee-tttc.org/ .
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