C. Sandt, Z. Dionnet, M. Toplak, E. Fernández, R. Brunetto, Ferenc Borondics
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引用次数: 10
Abstract
We compared hyperspectral infrared raster maps and images for contrast, definition and resolution of the same
samples recorded with a confocal microscope coupled with a synchrotron radiation source vs a Focal Plane Array (FPA)
detector equipped microscope. Biological samples (hair and skin sections) and astrophysics samples (meteoritic grains)
were used. The samples presented are a few microns in size, such as embedded particles, a single unique cell or thin
layer. Our results show that the actual spatial resolution and contrast of FPA images were lower than spectral maps from
the confocal microscope. The FPA microscope also produced measurements that lacked accuracy: size of sample
features and peak intensity were inaccurately estimated. More surprisingly, the intensity of absorption peaks in the FPA
images was lower than the intensity measured from the same sample with a confocal microscope. Our measurements
underlined the complementarity of FPA and confocal microscopes. FPA can be used to quickly measure the overall
composition of a sample and detect the distribution of its components, but may fail measuring the exact chemical
composition of the small features and may not detect weak spectral differences between adjacent positions. The
averaging effect of aperture-less systems not only affects image resolution but also lowers their spectral accuracy.
Confocal microscopes are inherently slower but give a more accurate measurement of the local composition at the
diffraction limit.
期刊介绍:
JSI—Journal of Spectral Imaging is the first journal to bring together current research from the diverse research areas of spectral, hyperspectral and chemical imaging as well as related areas such as remote sensing, chemometrics, data mining and data handling for spectral image data. We believe all those working in Spectral Imaging can benefit from the knowledge of others even in widely different fields. We welcome original research papers, letters, review articles, tutorial papers, short communications and technical notes.