The effects of various scaling instruments on the surface roughness of monolithic zirconia and lithium disilicate.

Pub Date : 2023-09-06 DOI:10.26650/eor.20231109111
Mustafa Yilmaz, Esra Demir, Emin Orkun Olcay
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Abstract

Purpose: This in vitro study aims to evaluate the effects of plastic piezoelectric maintenance tips on the surface roughness of monolithic lithium disilicate and zirconia.

Materials and methods: Fifty-four lithium disilicate and 54 zirconia disks were prepared with CAD/CAM. On each material, scaling with a stainless-steel curette or with a piezoelectric device using either a steel or plastic tip was conducted. The surface roughness of the materials before and after the instrumentation was measured with a profilometer. The changes in roughness of the materials according to the scaling methods were analyzed with generalized linear models. Mann-Whitney U with Bonferroni correction was used for between-group comparisons.

Results: The instruments caused surface alterations on both materials (p=0.001), while the roughness change of lithium disilicate and zirconia specimens did not demonstrate any statistically significant difference with each other (p=0.274). However, the curette was found to cause significantly more (p=0.019) roughness change (0.259 ±0.405) on the specimens than the piezoelectric plastic tip (0.060 ±0.238).

Conclusion: Piezoelectric scalers with plastic tips cause less deterioration on monolithic zirconia and lithium disilicate surfaces when compared to stainless-steel hand curettes.

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各种阻垢剂对氧化锆和二硅酸锂整体表面粗糙度的影响
目的:本体外研究旨在评估塑料压电维持尖端对单片二硅酸锂和氧化锆表面粗糙度的影响。材料与方法:采用CAD/CAM技术制备了54个二硅酸锂圆盘和54个氧化锆圆盘。在每种材料上,使用不锈钢刮匙或使用钢或塑料尖端的压电装置进行除垢。使用轮廓仪测量仪器前后材料的表面粗糙度。用广义线性模型分析了材料粗糙度随标度方法的变化。Mann-Whitney U和Bonferroni校正用于组间比较。结果:仪器导致两种材料的表面变化(p=0.001),而二硅酸锂和氧化锆样品的粗糙度变化没有显示出任何统计学上的显著差异(p=0.274)。然而,与压电塑料尖端(0.060±0.238)相比,刮匙在试样上引起的粗糙度变化(0.259±0.405)明显更大(p=0.019)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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