J. Boman, M. Langer, X. Pei, S. Guo, R. K. Pathak, S. M. Gaita, M. Hu, M. Hallquist
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期刊介绍：
X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.
Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.
Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.
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