{"title":"An unsupervised one-class-classifier support vector machine to simultaneously monitor location and scale of multivariate quality characteristics","authors":"Arijit Maji, I. Mukherjee","doi":"10.1108/ijqrm-09-2021-0316","DOIUrl":null,"url":null,"abstract":"PurposeThe purpose of this study is to propose an effective unsupervised one-class-classifier (OCC) support vector machine (SVM)-based single multivariate control chart (OCC-SVM) to simultaneously monitor “location” and “scale” shifts of a manufacturing process.Design/methodology/approachThe step-by-step approach to developing, implementing and fine-tuning the intrinsic parameters of the OCC-SVM chart is demonstrated based on simulation and two real-life case examples.FindingsA comparative study, considering varied known and unknown response distributions, indicates that the OCC-SVM is highly effective in detecting process shifts of samples with individual observations. OCC-SVM chart also shows promising results for samples with a rational subgroup of observations. In addition, the results also indicate that the performance of OCC-SVM is unaffected by the small reference sample size.Research limitations/implicationsThe sample responses are considered identically distributed with no significant multivariate autocorrelation between sample observations.Practical implicationsThe proposed easy-to-implement chart shows satisfactory performance to detect an out-of-control signal with known or unknown response distributions.Originality/valueVarious multivariate (e.g. parametric or nonparametric) control chart(s) are recommended to monitor the mean (e.g. location) and variance (e.g. scale) of multiple correlated responses in a manufacturing process. However, real-life implementation of a parametric control chart may be complex due to its restrictive response distribution assumptions. There is no evidence of work in the open literature that demonstrates the suitability of an unsupervised OCC-SVM chart to simultaneously monitor “location” and “scale” shifts of multivariate responses. Thus, a new efficient OCC-SVM single chart approach is proposed to address this gap to monitor a multivariate manufacturing process with unknown response distributions.","PeriodicalId":14193,"journal":{"name":"International Journal of Quality & Reliability Management","volume":" ","pages":""},"PeriodicalIF":2.7000,"publicationDate":"2021-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Quality & Reliability Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1108/ijqrm-09-2021-0316","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MANAGEMENT","Score":null,"Total":0}
引用次数: 0
Abstract
PurposeThe purpose of this study is to propose an effective unsupervised one-class-classifier (OCC) support vector machine (SVM)-based single multivariate control chart (OCC-SVM) to simultaneously monitor “location” and “scale” shifts of a manufacturing process.Design/methodology/approachThe step-by-step approach to developing, implementing and fine-tuning the intrinsic parameters of the OCC-SVM chart is demonstrated based on simulation and two real-life case examples.FindingsA comparative study, considering varied known and unknown response distributions, indicates that the OCC-SVM is highly effective in detecting process shifts of samples with individual observations. OCC-SVM chart also shows promising results for samples with a rational subgroup of observations. In addition, the results also indicate that the performance of OCC-SVM is unaffected by the small reference sample size.Research limitations/implicationsThe sample responses are considered identically distributed with no significant multivariate autocorrelation between sample observations.Practical implicationsThe proposed easy-to-implement chart shows satisfactory performance to detect an out-of-control signal with known or unknown response distributions.Originality/valueVarious multivariate (e.g. parametric or nonparametric) control chart(s) are recommended to monitor the mean (e.g. location) and variance (e.g. scale) of multiple correlated responses in a manufacturing process. However, real-life implementation of a parametric control chart may be complex due to its restrictive response distribution assumptions. There is no evidence of work in the open literature that demonstrates the suitability of an unsupervised OCC-SVM chart to simultaneously monitor “location” and “scale” shifts of multivariate responses. Thus, a new efficient OCC-SVM single chart approach is proposed to address this gap to monitor a multivariate manufacturing process with unknown response distributions.
期刊介绍:
In today''s competitive business and industrial environment, it is essential to have an academic journal offering the most current theoretical knowledge on quality and reliability to ensure that top management is fully conversant with new thinking, techniques and developments in the field. The International Journal of Quality & Reliability Management (IJQRM) deals with all aspects of business improvements and with all aspects of manufacturing and services, from the training of (senior) managers, to innovations in organising and processing to raise standards of product and service quality. It is this unique blend of theoretical knowledge and managerial relevance that makes IJQRM a valuable resource for managers striving for higher standards.Coverage includes: -Reliability, availability & maintenance -Gauging, calibration & measurement -Life cycle costing & sustainability -Reliability Management of Systems -Service Quality -Green Marketing -Product liability -Product testing techniques & systems -Quality function deployment -Reliability & quality education & training -Productivity improvement -Performance improvement -(Regulatory) standards for quality & Quality Awards -Statistical process control -System modelling -Teamwork -Quality data & datamining