{"title":"The Sensitivity of Bayesian Fit Indices to Structural Misspecification in Structural Equation Modeling","authors":"Chunhua Cao, Benjamin Lugu, Jujia Li","doi":"10.1080/10705511.2023.2253497","DOIUrl":null,"url":null,"abstract":"This study examined the false positive (FP) rates and sensitivity of Bayesian fit indices to structural misspecification in Bayesian structural equation modeling. The impact of measurement quality,...","PeriodicalId":21964,"journal":{"name":"Structural Equation Modeling: A Multidisciplinary Journal","volume":"20 22","pages":""},"PeriodicalIF":2.5000,"publicationDate":"2023-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Structural Equation Modeling: A Multidisciplinary Journal","FirstCategoryId":"102","ListUrlMain":"https://doi.org/10.1080/10705511.2023.2253497","RegionNum":2,"RegionCategory":"心理学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATHEMATICS, INTERDISCIPLINARY APPLICATIONS","Score":null,"Total":0}
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Abstract
This study examined the false positive (FP) rates and sensitivity of Bayesian fit indices to structural misspecification in Bayesian structural equation modeling. The impact of measurement quality,...
期刊介绍：
Structural Equation Modeling: A Multidisciplinary Journal publishes refereed scholarly work from all academic disciplines interested in structural equation modeling. These disciplines include, but are not limited to, psychology, medicine, sociology, education, political science, economics, management, and business/marketing. Theoretical articles address new developments; applied articles deal with innovative structural equation modeling applications; the Teacher’s Corner provides instructional modules on aspects of structural equation modeling; book and software reviews examine new modeling information and techniques; and advertising alerts readers to new products. Comments on technical or substantive issues addressed in articles or reviews published in the journal are encouraged; comments are reviewed, and authors of the original works are invited to respond.
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