T. Hossfeld, P. Heegaard, M. Varela, Sebastian Möller
{"title":"QoE beyond the MOS: an in-depth look at QoE via better metrics and their relation to MOS","authors":"T. Hossfeld, P. Heegaard, M. Varela, Sebastian Möller","doi":"10.1007/s41233-016-0002-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":74625,"journal":{"name":"Quality and user experience","volume":"276 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s41233-016-0002-1","citationCount":"83","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quality and user experience","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s41233-016-0002-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}