Investigation of co-evaporated polycrystalline Cu(In,Ga)S2 thin film yielding 16.0 % efficiency solar cell

IF 1.6 Q3 PHYSICS, APPLIED EPJ Photovoltaics Pub Date : 2022-01-01 DOI:10.1051/epjpv/2022014
N. Barreau, E. Bertin, A. Crossay, O. Durand, L. Arzel, S. Harel, T. Lepetit, L. Assmann, E. Gautron, D. Lincot
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引用次数: 6

Abstract

The interest for pure sulfide Cu(In,Ga)S2 chalcopyrite thin films is increasing again because their optical properties make them relevant candidates to be applied as top cell absorbers in tandem structures. Nonetheless, their use as so is still hindered by the level of single-junction cells performance achieved so far, which are far below those demonstrated by selenide absorbers. Amongst the reasons at the origin of the limited efficiency of Cu(In,Ga)S2-based solar devices, one can mention the poor tolerance of S-chalcopyrite to Cu deficiency. In fact, Cu-poor Cu(In,Ga)S2 films contain CuIn5S8 thiospinel secondary phase which is harmful for device performance. In the present work, we investigate Cu(In,Ga)S2 thin films grown by a modified three-stage process making use of graded indium and gallium fluxes during the first stage. The resulting absorbers are single phase and made of large grains extended throughout the entire film thickness. We propose that such a morphology is a proof of the recrystallization of the entire film during the synthesis. Devices prepared from those films and buffered with bath deposited CdS demonstrate outstanding efficiency of 16.0%. Replacing CdS by Zn(O,S) buffer layer leads to increased open circuit voltage and short circuit current; however, performance become limited by lowered fill factor.
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共蒸发多晶Cu(In,Ga)S2薄膜制备效率16.0%太阳能电池的研究
由于纯硫化物Cu(In,Ga)S2黄铜矿薄膜的光学性质使其成为串联结构中顶端吸收剂的候选材料,因此对其的兴趣再次增加。尽管如此,它们的使用仍然受到迄今为止单结电池性能水平的阻碍,这远远低于硒化物吸收剂所展示的水平。在Cu(In,Ga) s2基太阳能器件效率有限的原因中,可以提到s -黄铜矿对Cu缺乏的耐受性差。事实上,贫铜Cu(In,Ga)S2薄膜中含有CuIn5S8硫尖晶石次级相,对器件性能不利。在本工作中,我们研究了Cu(In,Ga)S2薄膜在一个改进的三阶段过程中生长,在第一阶段使用梯度铟和镓的通量。所得到的吸收剂是单相的,并且是由贯穿整个薄膜厚度的大晶粒组成的。我们认为这种形态是整个薄膜在合成过程中再结晶的证明。由这些薄膜制备的器件,用浴沉积的CdS进行缓冲,显示出16.0%的优异效率。用Zn(O,S)缓冲层代替CdS,导致开路电压增大,短路电流增大;然而,由于填充系数降低,性能受到限制。
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来源期刊
EPJ Photovoltaics
EPJ Photovoltaics PHYSICS, APPLIED-
CiteScore
2.30
自引率
4.00%
发文量
15
审稿时长
8 weeks
期刊最新文献
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