Determination of optical properties of percolated nanostructures using an optical resonator system

Abstract

In this work, methods are introduced to the determination of optical properties of thin silver films and nanostructures. We present an optical resonant system consisting of a mirror, a transparent layer and a thin silver film. The layer sequences and the nanostructure of the thin films are investigated by optical methods consist of reflectance measurements. The structures are analyzed by atomic force microscopy and scanning electron microscopy. The optical properties are determined by modeling the reflectance data. We have found that the growth mechanisms of the silver layer are correlated to its optical properties. It also found that temperature treatments produce isolated particles with a narrow plasmon resonance.