D. Gil, J. Gracia, J. Baraza-Calvo, L. J. Saiz, P. Gil
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引用次数: 16
Abstract
Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which is an important step towards the development of mitigation techniques for such threats.
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