M. Ishida, K. Ichiyama, Tasuku Fujibe, D. Watanabe, M. Kawabata
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Abstract
This paper proposes a real-time testing method for multilevel signal interfaces. It utilizes multilevel drivers that can modulate both the voltage and timing of an output signal, and multilevel comparators based on a dynamic threshold concept. The authors also consider the impact on test cost of the proposed system and compares that cost with a conventional binary test system.
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