Comparison of matrix effects on atomic emission spectrometers with nitrogen microwave induced plasma

Q4 Chemistry Analitika i Kontrol Pub Date : 2021-01-01 DOI:10.15826/analitika.2021.25.4.004
E. V. Polyakova, O. V. Pelipasov
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Abstract

The creation and implementation of new sources of sample excitation and spectrometers based on them into the practice of analytical laboratories raises many questions for researchers about the obtained analytical characteristics of new equipment and analysis methods. The most important characteristics of any method include detection limits, accuracy and reproducibility of the results obtained. Matrix elements can have a significant effect on these parameters. The paper shows a comparison of the change in the intensities of analytical lines of elements in the presence of matrix elements with ionization potentials of 5.13 - 10.48 eV (Na, Cu, Pb, Cd, Zn, In, Ga, Bi) in the concentration range of 0 - 1 wt %. on commercially available atomic emission spectrometers with microwave plasma Grand-MP ("VMK-Optoelektronika") and Agilent MP-AES 4100 (Agilent Technologies). It is shown that the magnitude of the matrix effect in these excitation sources depends on the ionization potential of the matrix element and the total energy of the analyte line. A significant effect of matrix elements with a concentration of up to 1% wt. on the intensity of spectral lines of atoms and ions of the sample. Elements with medium and high ionization energies practically do not affect the intensity of atomic spectral lines of impurity elements and lead to a decrease in the intensity of ionic lines. The influence of easily ionized elements is more pronounced - both depressing and amplifying effects are observed, probably caused by both a change in the concentration of electrons in the plasma, leading to a linear change in the equilibrium between atoms and ions, and a decrease in the plasma temperature. An increase in the power supplied to the plasma on the Grand-MP spectrometer leads to a decrease in the effect of easily ionized elements on the intensity of the spectral lines of the elements. It is shown that the plasma in the Grand-MP spectrometer has better resistance to matrix influences as compared to the Agilent MP-AES 4100, which is associated with a large plasma volume and a higher input power.
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氮微波诱导等离子体原子发射光谱仪中基质效应的比较
在分析实验室的实践中建立和实施新的样品激发源和基于它们的光谱仪,给研究人员提出了许多关于新设备和分析方法所获得的分析特性的问题。任何方法最重要的特征包括检出限、准确性和所得结果的可重复性。矩阵元素对这些参数有显著的影响。本文比较了离子电势为5.13 ~ 10.48 eV的基体元素(Na、Cu、Pb、Cd、Zn、in、Ga、Bi)在0 ~ 1 wt %浓度范围内的分析谱线强度变化。商用微波等离子体原子发射光谱仪grandmp(“VMK-Optoelektronika”)和Agilent MP-AES 4100 (Agilent Technologies)。结果表明,这些激发源中基质效应的大小取决于基质元素的电离势和分析线的总能量。浓度高达1% wt的基质元素对样品原子和离子谱线强度的显著影响。中高电离能的元素实际上并不影响杂质元素原子谱线的强度,反而导致离子谱线强度的降低。易电离元素的影响更为明显——观察到抑制和放大效应,可能是由于等离子体中电子浓度的变化,导致原子和离子之间平衡的线性变化,以及等离子体温度的降低。在Grand-MP光谱仪上,给等离子体提供的功率的增加导致易电离元素对元素谱线强度的影响减小。结果表明,与安捷伦MP-AES 4100相比,Grand-MP光谱仪中的等离子体具有更好的抗基质影响能力,这与大等离子体体积和更高的输入功率有关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Analitika i Kontrol
Analitika i Kontrol Chemistry-Analytical Chemistry
CiteScore
0.90
自引率
0.00%
发文量
15
期刊介绍: Analitika i Kontrol is a scientific journal covering theoretical and applied aspects of analytical chemistry and analytical control, published since autumn 1997. Founder and publisher of the journal is the Ural Federal University named after the first President of Russia Boris Yeltsin (UrFU, Ekaterinburg).
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