{"title":"Use of Ultrasonic Cavitation in Surface Cleaning: A Mathematical Model to Relate Cleaning Efficiency and Surface Erosion Rate","authors":"R. Nagarajan","doi":"10.17764/JIET.49.2.T654225W78220764","DOIUrl":null,"url":null,"abstract":"Ultrasonic cleaning, employing frequencies in the range of 40-200 kHz, is widely used in many industries requiring precision cleanliness in the micrometer to submicron particle size range—e.g., semiconductor wafer fabrication, hard disk drive manufacturing, and integrated circuit assembly. One overriding concern with the use of ultrasonic cleaning for delicate components and assemblies has been the specter of cavitation erosion—surface material loss and other functional degradation due to the impact of shock waves generated by collapsing bubbles and bubble clusters in an oscillating acoustic field. The simultaneous processes of surface cleaning and surface erosion in the presence of a high-frequency ultrasonic field (⩾ 58 kHz) are described here mathematically, and the equations are coupled to allow conceptual optimization of parametric settings to maximize cleaning efficiency while minimizing the level of erosion damage. This theoretical analysis is presented for various ultrasonic field conditions (freq...","PeriodicalId":35935,"journal":{"name":"Journal of the IEST","volume":"49 1","pages":"40-50"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the IEST","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17764/JIET.49.2.T654225W78220764","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 14
Abstract
Ultrasonic cleaning, employing frequencies in the range of 40-200 kHz, is widely used in many industries requiring precision cleanliness in the micrometer to submicron particle size range—e.g., semiconductor wafer fabrication, hard disk drive manufacturing, and integrated circuit assembly. One overriding concern with the use of ultrasonic cleaning for delicate components and assemblies has been the specter of cavitation erosion—surface material loss and other functional degradation due to the impact of shock waves generated by collapsing bubbles and bubble clusters in an oscillating acoustic field. The simultaneous processes of surface cleaning and surface erosion in the presence of a high-frequency ultrasonic field (⩾ 58 kHz) are described here mathematically, and the equations are coupled to allow conceptual optimization of parametric settings to maximize cleaning efficiency while minimizing the level of erosion damage. This theoretical analysis is presented for various ultrasonic field conditions (freq...
期刊介绍:
The Journal of the IEST is an official publication of the Institute of Environmental Sciences and Technology and is of archival quality and noncommercial in nature. It was established to advance knowledge through technical articles selected by peer review, and has been published for over 50 years as a benefit to IEST members and the technical community at large as as a permanent record of progress in the science and technology of the environmental sciences