{"title":"Transport properties of SM doped CeO2 ceramics","authors":"S. Ramesh","doi":"10.2298/pac2104366r","DOIUrl":null,"url":null,"abstract":"Pure (CeO2) and Sm doped (Ce0.8Sm0.2O2-?) ceria were synthesized by the maltose and pectin-modified solgel process. The dense ceramic samples, with relative density of >96%TD, were prepared by sintering of the pressed pellets at 1300?C for 6 h. The structure and phase of Ce0.8Sm0.2O2-? samples were analysed by XRD method. Raman spectroscopy studies were carried out to study the Sm-doping effect. The microstructural images were recorded by FE-SEM. The electrical properties were measured by impedance spectroscopy. The association and the migration energies were calculated from the dielectric loss tangent. The Jonscher power law was applied to study the frequency variation of electrical conductivity. The electricmodulus studies confirm that the charge carriers follow the hopping mechanism.","PeriodicalId":20596,"journal":{"name":"Processing and Application of Ceramics","volume":"1 1","pages":""},"PeriodicalIF":0.9000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Processing and Application of Ceramics","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.2298/pac2104366r","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, CERAMICS","Score":null,"Total":0}
引用次数: 3
Abstract
Pure (CeO2) and Sm doped (Ce0.8Sm0.2O2-?) ceria were synthesized by the maltose and pectin-modified solgel process. The dense ceramic samples, with relative density of >96%TD, were prepared by sintering of the pressed pellets at 1300?C for 6 h. The structure and phase of Ce0.8Sm0.2O2-? samples were analysed by XRD method. Raman spectroscopy studies were carried out to study the Sm-doping effect. The microstructural images were recorded by FE-SEM. The electrical properties were measured by impedance spectroscopy. The association and the migration energies were calculated from the dielectric loss tangent. The Jonscher power law was applied to study the frequency variation of electrical conductivity. The electricmodulus studies confirm that the charge carriers follow the hopping mechanism.
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