The effects of grain structure on electromigration failure of the lead-free solder bump

Yuanxiang Zhang, L. Liang, Dongdong Zhu
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引用次数: 1

Abstract

ENGINEERING MODELLING 31 (2018) 3, 79-93 79 The effects of grain structure on electromigration failure of the lead-free solder bump Yuanxiang Zhang(1), Lihua Liang(2), Dongdong Zhu(1) (1) Key Laboratory of Air-driven Equipment Technology of Zhejiang Province, Quzhou University, Quzhou 324000, CHINA e-mail: zhangyx@qzu.zj.cn (2) College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou 310014, CHINA
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晶粒结构对无铅凸点电迁移失效的影响
张元祥(1),梁丽华(2),朱东东(1)(1)衢州学院气动装备技术浙江省重点实验室,浙江衢州324000 e-mail: zhangyx@qzu.zj.cn(2)浙江工业大学机械工程学院,浙江杭州310014
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来源期刊
International Journal for Engineering Modelling
International Journal for Engineering Modelling Engineering-Mechanical Engineering
CiteScore
0.90
自引率
0.00%
发文量
12
期刊介绍: Engineering Modelling is a refereed international journal providing an up-to-date reference for the engineers and researchers engaged in computer aided analysis, design and research in the fields of computational mechanics, numerical methods, software develop-ment and engineering modelling.
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