New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry

F. R. Moreno, S. Cordova, Héctor Alej, R. Molina, Homero Jaime Rodríguez Centeno, G. Badilla
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Abstract

Based on the use of industrial and computing engineering tools, a new method was developed with a VEGAM matrix for the rapid and effective detection of the effects of the environment (climate and air pollution) on equipment and machines used in the electronics industry. This was done with a staff developed by experts from the National Technological Institute based in the Technological Institute of Mexicali, obtaining an efficiency of 95% in its application in the electronic industry of the city of Mexicali.
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电子工业中环境因素与金属表面劣化的新分析方法
基于工业和计算工程工具的使用,开发了一种新的方法,使用VEGAM矩阵快速有效地检测环境(气候和空气污染)对电子工业中使用的设备和机器的影响。这是由设在墨西卡利技术研究所的国家技术研究所的专家开发的工作人员完成的,在墨西卡利市的电子工业中,其应用效率达到95%。
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