{"title":"Preparation of Silicon Nanowires Photocathode for Photoelectrochemical Water Splitting","authors":"Zainab K. Ali, Mazin A. Mahdi","doi":"10.30723/ijp.v20i4.1070","DOIUrl":null,"url":null,"abstract":"A metal-assisted chemical etching process employing p-type silicon wafers with varied etching durations is used to produce silicon nanowires. Silver nanoparticles prepared by chemical deposition are utilized as a catalyst in the formation of silicon nanowires. Images from field emission scanning electron microscopy confirmed that the diameter of SiNWs grows when the etching duration is increased. The photoelectrochemical cell's characteristics were investigated using p-type silicon nanowires as working electrodes. Linear sweep voltammetry (J-V) measurements on p-SiNWs confirmed that photocurrent density rose from 0.20 mA cm-2 to 0.92 mA cm-2 as the etching duration of prepared SiNWs increased from 15 to 30 min. The conversion efficiency (ƞ) was 0.47 for p-SiNWs prepared with a 15-minute etching time and 0.75 for p-SiNWs prepared with a 30-minute etching time. The cyclic voltammetry (CV) experiments performed at various scan rates validated the faradic behavior of p-SiNWS prepared for 15 and 30 min of etching. Because of the slow ion diffusion and the increased scanning rate, the capacitance decreased with increasing scanning rate. Mott-Schottky (M-S) investigation showed a significant carriers concentration of 3.66×1020 cm-3. According to the results of electrochemical impedance spectroscopy (EIS), the SiNWs photocathode prepared by etching for 30 min had a charge transfer resistance of 25.27 Ω, which is low enough to enhance interfacial charge transfer.","PeriodicalId":14653,"journal":{"name":"Iraqi Journal of Physics (IJP)","volume":"51 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iraqi Journal of Physics (IJP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.30723/ijp.v20i4.1070","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A metal-assisted chemical etching process employing p-type silicon wafers with varied etching durations is used to produce silicon nanowires. Silver nanoparticles prepared by chemical deposition are utilized as a catalyst in the formation of silicon nanowires. Images from field emission scanning electron microscopy confirmed that the diameter of SiNWs grows when the etching duration is increased. The photoelectrochemical cell's characteristics were investigated using p-type silicon nanowires as working electrodes. Linear sweep voltammetry (J-V) measurements on p-SiNWs confirmed that photocurrent density rose from 0.20 mA cm-2 to 0.92 mA cm-2 as the etching duration of prepared SiNWs increased from 15 to 30 min. The conversion efficiency (ƞ) was 0.47 for p-SiNWs prepared with a 15-minute etching time and 0.75 for p-SiNWs prepared with a 30-minute etching time. The cyclic voltammetry (CV) experiments performed at various scan rates validated the faradic behavior of p-SiNWS prepared for 15 and 30 min of etching. Because of the slow ion diffusion and the increased scanning rate, the capacitance decreased with increasing scanning rate. Mott-Schottky (M-S) investigation showed a significant carriers concentration of 3.66×1020 cm-3. According to the results of electrochemical impedance spectroscopy (EIS), the SiNWs photocathode prepared by etching for 30 min had a charge transfer resistance of 25.27 Ω, which is low enough to enhance interfacial charge transfer.
采用金属辅助化学蚀刻工艺,采用不同蚀刻时间的p型硅片制备硅纳米线。利用化学沉积法制备的银纳米粒子作为硅纳米线形成的催化剂。场发射扫描电镜图像证实,随着刻蚀时间的延长,SiNWs的直径增大。以p型硅纳米线为工作电极,研究了该光化学电池的性能。线性扫描伏安法(J-V)测量证实,随着刻蚀时间从15分钟增加到30分钟,p-SiNWs的光电流密度从0.20 mA cm-2增加到0.92 mA cm-2。刻蚀时间为15分钟的p-SiNWs的转换效率为0.47,刻蚀时间为30分钟的p-SiNWs的转换效率为0.75。在不同扫描速率下进行的循环伏安(CV)实验验证了蚀刻15和30分钟制备的p-SiNWS的faradic行为。由于离子扩散缓慢和扫描速率的增加,电容随扫描速率的增加而减小。Mott-Schottky (M-S)调查显示,载体浓度显著为3.66×1020 cm-3。电化学阻抗谱(EIS)结果表明,蚀刻30 min制备的SiNWs光电阴极的电荷转移电阻为25.27 Ω,足以增强界面电荷转移。