M. Vanlandingham, T. Nguyen, W. E. Byrd, Jon Martin
{"title":"On the use of the atomic force microscope to monitor physical degradation of polymeric coating surfaces","authors":"M. Vanlandingham, T. Nguyen, W. E. Byrd, Jon Martin","doi":"10.1007/BF02720133","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":15467,"journal":{"name":"Journal of Coatings Technology","volume":"62 1","pages":"43-50"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Coatings Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/BF02720133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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