High temperature aging of enameled copper wire — Relationships between chemical structure and electrical behavior

B. Petitgas, G. Seytre, O. Gain, G. Boiteux, I. Royaud, A. Serghei, A. Gimenez, A. Anton
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引用次数: 16

Abstract

This work presents the physico-chemical behavior of several enameled copper wires systems such as PolyEsterImide (PEI)/PolyAmideImide (PAI) or PAI based multi layers compared to PolyImide (PI) which remains the basic enamel material for high temperature applications. The structural, thermal and electrical properties of these systems have been investigated before and after aging in the 200°C-400°C temperature range by thermogravimetric analysis (TGA), ATR-FTIR microscopy, thermomechanical analysis (TMA) and dielectric relaxation spectroscopy (DRS). It has been particularly interesting to carry out physico-chemical analysis directly on enameled wires to improve the understanding of their thermal and electrical behaviour. Dielectric spectroscopy has indicated a loss of insulating properties during the thermal cycle especially for PEI-containing enamels whereas the properties of PI and PAI have been maintained. TGA and IR analyses have not only allowed confirming the PI and PAI high thermal performances, but have also given information on the thermal and chemical stability of PEI/PAI. Such investigations could be helpful for improving the enameled wire high temperature performances.
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漆包线的高温老化。化学结构与电性能的关系
这项工作介绍了几种漆包铜线系统的物理化学行为,如聚酯酰亚胺(PEI)/聚酰胺酰亚胺(PAI)或基于PAI的多层,而聚酰亚胺(PI)仍然是高温应用的基本搪瓷材料。通过热重分析(TGA)、ATR-FTIR显微镜、热力学分析(TMA)和介电弛豫光谱(DRS)研究了这些体系在200°C-400°C温度范围内老化前后的结构、热学和电学性能。直接对漆包线进行物理化学分析以提高对其热学和电学行为的理解是特别有趣的。介电光谱表明,在热循环过程中,特别是对于含PI的搪瓷,绝缘性能会损失,而PI和PAI的性能却保持不变。热重分析和红外光谱分析不仅证实了PEI和PAI的高热性能,而且还提供了PEI/PAI的热稳定性和化学稳定性的信息。这些研究有助于提高漆包线的高温性能。
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