{"title":"The Structural Disorder Model: Pressure Induced Transitions in the Semiconductors Si and Ge","authors":"P. Dixit, B. A. Vaid, K. Sharma","doi":"10.1002/PSSB.2221330108","DOIUrl":null,"url":null,"abstract":"The structural disorder model, recently proposed by the authors to explain the thermodynamic properties near the transitions of first order, is generalized to include the pressure induced transition in the semiconductors Ge and Si. The calculated values show at least a in order of magnitude agreement with the experimental data. \n \n \n \nDas kurzlich von den Autoren vorgeschlagene Fehlordnungsmodell zur Erklarung der thermodynamischen Eigenschaften in der Nahe eines Ubergangs erster Ordnung wird verallgemeiner und schliest den druckinduzierten Ubergang in den Halbleitern Ge und Si ein. Die berechneten Werte befinden sich in grosenordnungsmasiger Ubereinstimmung mit den experimentellen Daten.","PeriodicalId":11087,"journal":{"name":"Day 1 Tue, January 11, 2022","volume":"175 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1986-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Day 1 Tue, January 11, 2022","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/PSSB.2221330108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The structural disorder model, recently proposed by the authors to explain the thermodynamic properties near the transitions of first order, is generalized to include the pressure induced transition in the semiconductors Ge and Si. The calculated values show at least a in order of magnitude agreement with the experimental data.
Das kurzlich von den Autoren vorgeschlagene Fehlordnungsmodell zur Erklarung der thermodynamischen Eigenschaften in der Nahe eines Ubergangs erster Ordnung wird verallgemeiner und schliest den druckinduzierten Ubergang in den Halbleitern Ge und Si ein. Die berechneten Werte befinden sich in grosenordnungsmasiger Ubereinstimmung mit den experimentellen Daten.