Delphine Coiras, Richard-Nicolas Verrone, Andrea Campos, M. Cabié, L. Gallais, M. Minissale, J. Lumeau, J. Natoli, K. Iliopoulos
{"title":"Laser Annealing of Sb2Te3 2D Layers towards Nonlinear Optical Applications","authors":"Delphine Coiras, Richard-Nicolas Verrone, Andrea Campos, M. Cabié, L. Gallais, M. Minissale, J. Lumeau, J. Natoli, K. Iliopoulos","doi":"10.3390/opt3030023","DOIUrl":null,"url":null,"abstract":"In this work, we performed laser annealing of thin Sb2Te3 films to optimize crystallization time and their nonlinear optical properties. The annealed layers were studied by electron microscopy and UV–Vis spectrophotometry. Their nonlinear optical response was investigated by nonlinear transmission and Z-scan measurements. These studies were performed by a femtosecond laser system providing 400 fs laser pulses at 1030 nm. The results were compared with previous findings based on studies of oven-annealed thin films.","PeriodicalId":54548,"journal":{"name":"Progress in Optics","volume":"12 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Progress in Optics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.3390/opt3030023","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Materials Science","Score":null,"Total":0}
引用次数: 1
Abstract
In this work, we performed laser annealing of thin Sb2Te3 films to optimize crystallization time and their nonlinear optical properties. The annealed layers were studied by electron microscopy and UV–Vis spectrophotometry. Their nonlinear optical response was investigated by nonlinear transmission and Z-scan measurements. These studies were performed by a femtosecond laser system providing 400 fs laser pulses at 1030 nm. The results were compared with previous findings based on studies of oven-annealed thin films.
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