Internal charging phenomena and change of electrical properties in electron beam irradiated insulating materials for spacecraft

K. Yagai, H. Miyake, Y. Tanaka, T. Takada
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引用次数: 2

Abstract

The purpose of our research work is to evaluate some electrical properties of electron beam irradiated insulating materials for spacecraft. The spacecraft like a communication or a broadcasting satellite flying in GEO (Geostationary Orbit) is always exposed to plasma and/or radioactive-rays such as α-, β-, and γ-rays. When the insulating materials, in which the spacecraft is wrapped to keep temperature in it stable, are irradiated by the high energy electron beam, sometimes an unexpected accident due to an electrostatic discharge occurs. The accident sometimes causes a serious mission error of spacecraft. However, it has not known how the irradiation affects to the electrical properties of the materials. In our previous research work, we especially focused on an internal charging phenomenon which must affect to the electrical properties of irradiated polymers for spacecraft such as Polyimide (PI) and Polytetrafluoroethylene (PTFE). Judging from the measurement results, it is found that an amount of negative charge accumulation in PTFE is much larger than that in PI. It seems that the charge accumulation in polymers including fluorine by irradiation of electron beam is larger than that in other polymeric materials. Furthermore, the accumulated charge in the polymer including fluorine remains for long time after irradiation. Such results indicate that the electrical properties are changed by the irradiation. Therefore, we tried to compare the charge accumulation properties between the irradiated and non-irradiated polymeric materials including fluorine. By applying dc stress to them, space charge accumulation processes in various irradiated materials are observed. From the results, it is found that the charge accumulation processes in irradiated materials are completely different from the non-irradiated materials.
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本文的研究目的是评价航天器用电子束辐照绝缘材料的一些电学性能。在地球静止轨道上飞行的通信或广播卫星等航天器总是暴露在等离子体和/或放射性射线(如α-, β-和γ射线)下。当包裹航天器以保持其内部温度稳定的绝缘材料受到高能电子束照射时,有时会发生由于静电放电而导致的意外事故。这种事故有时会导致航天器的严重任务错误。然而,辐照对材料电性能的影响尚不清楚。在我们之前的研究工作中,我们特别关注了一种内部充电现象,这种现象会影响聚酰亚胺(PI)和聚四氟乙烯(PTFE)等航天器用辐照聚合物的电学性能。从测量结果来看,PTFE中的负电荷积累量远大于PI。电子束辐照下含氟聚合物的电荷积累似乎比其他聚合物大。此外,含氟聚合物中的累积电荷在辐照后可长时间保留。这些结果表明辐照改变了材料的电学性质。因此,我们试图比较辐照和未辐照的含氟高分子材料的电荷积累特性。通过对其施加直流应力,观察了不同辐照材料的空间电荷积累过程。结果表明,辐照材料中的电荷积累过程与未辐照材料完全不同。
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