{"title":"High conversion-gain pixels in a standard CMOS image sensor process","authors":"Song Chen, E. Fossum","doi":"10.1109/IPCON.2017.8116195","DOIUrl":null,"url":null,"abstract":"This paper presents a new technique to achieve high pixel conversion gain (CG) in a standard 0.18 um CMOS image sensor process. CG of 121 uV/e- and read noise of 3.2 erms are measured in the prototype sensor.","PeriodicalId":6657,"journal":{"name":"2017 IEEE Photonics Conference (IPC) Part II","volume":"6 1","pages":"485-486"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Photonics Conference (IPC) Part II","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPCON.2017.8116195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents a new technique to achieve high pixel conversion gain (CG) in a standard 0.18 um CMOS image sensor process. CG of 121 uV/e- and read noise of 3.2 erms are measured in the prototype sensor.
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