Alex W. H. Choy, B. Luk, Louis K. P. Liu, Sheng Chen
{"title":"Can and Zigbee Based Distributed Control Architecture: Electroplating Applications","authors":"Alex W. H. Choy, B. Luk, Louis K. P. Liu, Sheng Chen","doi":"10.1177/002029401004300306","DOIUrl":null,"url":null,"abstract":"In this paper, the application of the distributed control architecture using low-cost hybrid wired/wireless control network in the electroplating line control system design is described. The feasibility of implementing condition monitoring under this proposed control platform for increasing the system reliability and reducing the scrape rate is also discussed.","PeriodicalId":49849,"journal":{"name":"Measurement & Control","volume":"58 1","pages":"89-94"},"PeriodicalIF":1.3000,"publicationDate":"2010-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement & Control","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1177/002029401004300306","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, the application of the distributed control architecture using low-cost hybrid wired/wireless control network in the electroplating line control system design is described. The feasibility of implementing condition monitoring under this proposed control platform for increasing the system reliability and reducing the scrape rate is also discussed.
期刊介绍:
Measurement and Control publishes peer-reviewed practical and technical research and news pieces from both the science and engineering industry and academia. Whilst focusing more broadly on topics of relevance for practitioners in instrumentation and control, the journal also includes updates on both product and business announcements and information on technical advances.