HREM Characterization of Interfaces in Thin MOCVD Superconducting Films

D. Dorignac, S. Schamm, C. Grigis, J. Santiso, G. Garcia, A. Figueras
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Abstract

This paper is concerned with high-T c superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces-yttria stabilized zirconia buffer /(1-102)-sapphire substrate, YBa 2 Cu 3 O 7-x film/Y 2 O 3 precipitates as well as YBa 2 Cu 3 O 7-x film/(001)-NdGaO 3 , -SrTiO 3 , and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.
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MOCVD超导体薄膜界面的HREM表征
本文研究了用金属-有机化学气相沉积法制备的高温超导化合物。利用高分辨电子显微镜研究了不同类型界面——钇稳定氧化锆缓冲液/(1-102)-蓝宝石衬底、YBa 2 Cu 3 O 7-x薄膜/ y2 O 3沉淀物以及YBa 2 Cu 3 O 7-x薄膜/(001)- ndgao 3、- srtio 3和- mgo衬底的纳米结构。通过计算机模拟,确定了各界面间的取向关系和相应的层序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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