Electron transport in co-evaporated thin film and melt-spun ribbon Al1−xMnx alloys

Abstract

Accurate measurements of the d.c. electrical resistivity (between 30 and 300 K) and of the thermoelectric power (between 80 and 300 K) were performed on two types of well-characterized Al_1−xMn_x alloy samples: amorphous thin films (with 10 at.% ⩽ x ⩽ 14 at.%) deposited by co-evaporation on cold substrates, and Al₈₉Mn₁₁ melt-spun ribbon in quasi-crystalline (asprepared) and crystalline (annealed) states. The results are compared and emphasize the sensitivity of the transport properties to structural changes.