Thin Films of Zirconia-Phosphate Glasses Deposited by an Aerosol CVD Process

J. Deschanvres, J. Vaca, J. Joubert
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引用次数: 2

Abstract

The polycrystalline state of the ZrO 2 films was an disadvantage for some specific protective coating applications. To resolve this fact we proposed to obtain an amorphous thin film by addition of P 2 O 5 , which will act as glass formator agent. With an aerosol CVD process by using zirconium acetylacetonate and triphenyl phosphate dissolved in a mixture of acetylacetone and benzyl alcohol, we achieved to deposit mixed P 2 O 5 -ZrO 2 films between 480°C and 600°C. The P 2 O 5 content varied from 0% up to 60%. By measuring systematically the composition of the film we have noticed the influence on the composition of the films, on the one hand of the hygrometric degree of the carrier gas and on the other hand of the temperature used for the dissolution of the organometallic precursors in the solvent. The highest the dissolution temperature was, the most the phosphorus content was. After an annealing at 500°C during one hour, the films exhibited by X-ray diffraction analysis an amorphous structure and a very good transparency. More over the evolution of the I.R. spectra between 1200 cm -1 and 900 cm -1 and around 400 cm -1 are discussed in function of the composition of the films.
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气溶胶气相沉积法制备磷酸锆玻璃薄膜
zro2薄膜的多晶状态对某些特定的保护涂层应用是不利的。为了解决这一问题,我们提出通过添加p2o5作为玻璃形成剂来获得非晶薄膜。通过将乙酰丙酮锆和磷酸三苯酯溶解在乙酰丙酮和苯甲醇的混合物中,采用气溶胶气相沉积法,在480℃~ 600℃之间沉积了p2o -ZrO - 2混合薄膜。p2o5含量从0%到60%不等。通过系统地测量薄膜的组成,我们注意到载气的湿化程度和溶剂中溶解有机金属前驱体所用的温度对薄膜组成的影响。溶解温度越高,磷含量越高。经500℃退火1小时后,经x射线衍射分析,薄膜呈现出非晶态结构和良好的透明性。此外,本文还讨论了在1200 ~ 900 cm -1和400 cm -1之间的红外光谱随薄膜组成的变化。
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