Bicheng Guo, Boyang Zhang, Xiaowan Zheng, Siyuan Fang, Yue Fang, Bernard Sia, Lianxiang Yang
{"title":"Review of Shearography for Dual-Directional Measurement","authors":"Bicheng Guo, Boyang Zhang, Xiaowan Zheng, Siyuan Fang, Yue Fang, Bernard Sia, Lianxiang Yang","doi":"10.3390/opt3020014","DOIUrl":null,"url":null,"abstract":"Shearography is a coherent optical technique that allows the identification of the first derivative of deformation in the shearing direction. Due to direct measuring strain information, shearography is suited for non-destructive testing and evaluation (NDT/NDE). However, if there is a small defect parallel to the shearing direction, the first derivative of deformation in the direction has no noticeable change, and the defect is not visible. Therefore, the development of a shearography system with dual-directional simultaneous measurement of the first derivatives of deformation both in x- and y-directions is highly demanded in the field of NDT/NDE. It is suited to inspect complicated defects, such as long and narrow slots, microcracks, etc. This paper presents a review of shearography for different dual-directional systems developed in the last two decades. After a brief overview of shearography, the paper will display two dual-directional shearographic techniques—temporal phase-shift (TPS) and spatial phase-shift (SPS) methods. TPS dual-shearing systems are suited for static measurements, while the SPS dual-shearing systems are useful for dynamic measurements. The basic theories, optical layouts, and comparisons are presented. The advantages and disadvantages of practical applications are discussed.","PeriodicalId":54548,"journal":{"name":"Progress in Optics","volume":"6 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Progress in Optics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.3390/opt3020014","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Materials Science","Score":null,"Total":0}
引用次数: 1
Abstract
Shearography is a coherent optical technique that allows the identification of the first derivative of deformation in the shearing direction. Due to direct measuring strain information, shearography is suited for non-destructive testing and evaluation (NDT/NDE). However, if there is a small defect parallel to the shearing direction, the first derivative of deformation in the direction has no noticeable change, and the defect is not visible. Therefore, the development of a shearography system with dual-directional simultaneous measurement of the first derivatives of deformation both in x- and y-directions is highly demanded in the field of NDT/NDE. It is suited to inspect complicated defects, such as long and narrow slots, microcracks, etc. This paper presents a review of shearography for different dual-directional systems developed in the last two decades. After a brief overview of shearography, the paper will display two dual-directional shearographic techniques—temporal phase-shift (TPS) and spatial phase-shift (SPS) methods. TPS dual-shearing systems are suited for static measurements, while the SPS dual-shearing systems are useful for dynamic measurements. The basic theories, optical layouts, and comparisons are presented. The advantages and disadvantages of practical applications are discussed.