Assessment of silicon MOS and carbon nanotube FET performance limits using a general theory of ballistic transistors

Jing Guo, S. Datta, M. Lundstrom, M. Brink, P. McEuen, A. Javey, H. Dai, Hyoungsub Kim, P. McIntyre
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引用次数: 120

Abstract

A simple model for ballistic nanotransistors, which extends previous work by treating both the charge control and the quantum capacitance limits of MOSFET-like transistors, is presented. We apply this new model to MOSFET-like carbon nanotube FETs (CNTFETs) and to MOSFETs at the scaling limit. The device physics for operation at ballistic and quantum capacitance limits are explored. Based on the analysis of recently reported CNTFETs, we compare CNTFETs to MOSFETs. The potential performance advantages over Si that might be achieved at the scaling limit are established by using the new model.
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用弹道晶体管的一般理论评估硅MOS和碳纳米管场效应管的性能极限
本文提出了一个简单的弹道纳米晶体管模型,该模型扩展了以往的工作,同时处理了类mosfet晶体管的电荷控制和量子电容限制。我们将这种新模型应用于类mosfet碳纳米管fet (cntfet)和缩放极限下的mosfet。探讨了在弹道和量子电容极限下运行的器件物理特性。在分析最近报道的cntfet的基础上,我们比较了cntfet和mosfet。通过使用新模型,建立了在缩放极限下可能实现的硅的潜在性能优势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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