Yanqing Gao, Zhiming Huang, Y. Hou, Jing Wu, Wei Zhou, C. Ouyang, J. Chu
{"title":"Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers","authors":"Yanqing Gao, Zhiming Huang, Y. Hou, Jing Wu, Wei Zhou, C. Ouyang, J. Chu","doi":"10.1109/IRMMW-THZ.2015.7327441","DOIUrl":null,"url":null,"abstract":"High quality Mn<sub>1.56</sub>Co<sub>0.96</sub>Ni<sub>0.48</sub>O<sub>4</sub> films with different layers have been prepared on Pt//Ti/SiO<sub>2</sub>/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.","PeriodicalId":6577,"journal":{"name":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","volume":"16 4 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2015.7327441","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
High quality Mn1.56Co0.96Ni0.48O4 films with different layers have been prepared on Pt//Ti/SiO2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.
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