Noise in high-speed digital-to-analog converters

P. Bourgeois, T. Imaike, G. Goavec-Mérou, E. Rubiola
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引用次数: 6

Abstract

We report on the measurement of phase noise of high speed analog to digital converters in a full digital measurement setup and for various development boards. The tested configurations ensures a Nyquist rate higher than 100 MHz suitable for conventional ultralow noise devices. Several analog to digital converters featuring a SNR higher than 140 dB enable the measurement of AM and PM noise with a background noise of -185 dBc (floor) and -160 dBc (flicker, 10 Hz off the carrier) using cross-correlation technique.
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高速数模转换器中的噪声
我们报告了在全数字测量装置和各种开发板中高速模数转换器相位噪声的测量。经过测试的配置确保奈奎斯特速率高于100 MHz,适用于传统的超低噪声设备。一些信噪比高于140 dB的模数转换器可以使用互相关技术测量调幅和调幅噪声,背景噪声为-185 dBc(底面)和-160 dBc(闪烁,载波10 Hz)。
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