The probability of technical success and R&D appraisal

J. Hodge, Craig Hakkio
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Abstract

Two models that assess the probability of technical success are presented. The first model describes projects that are either complete successes or complete failures. The second model describes projects that may have partial success. The first model uses an expert evaluator's assessments of the probability of success of selected projects to parametrize a logit probability distribution. The results give implicit weights which can be employed in future analyses to calculate the expected level of success of new projects. The second model allows projects to be partially successful. Several methods of using an expert evaluator's opinion to determine the parameters of a beta distribution are developed.

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技术成功概率与研发评价
提出了两种评估技术成功概率的模型。第一个模型描述了完全成功或完全失败的项目。第二个模型描述了可能部分成功的项目。第一个模型使用专家评估者对选定项目成功概率的评估来参数化逻辑概率分布。结果给出了隐式权重,可用于未来的分析,以计算新项目的预期成功水平。第二种模式允许项目部分成功。开发了几种使用专家评估者意见来确定beta分布参数的方法。
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