Damaged Mechanism Research of RS232 Interface under Electromagnetic Pulse

Gao Jing, Ji-Yin Sun, Y. Chai, Wang Bo, Ling-Jiao Tao, Fei-Hu Bao
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引用次数: 1

Abstract

RS232 interface executes the role of Transportation and Communication, which has became the important interface between MCU of embedded system and peripheral equipment. Because RS232 mainly work in bottom of communication protocol, so it is important to protect the infrastructure of RS232. In test, pulse double electromagnetic is pulled into RS232 data transmission lines by coupling clamp, simulated differential-mode pulse voltage, basing on the test data, it will get the damaged mechanism of RS232 interface, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, and getting the performance evaluation of RS232 interface, moreover estimating the voltage pulse range of upper and lower bounds at the port in the normal and damage state.
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电磁脉冲作用下RS232接口损坏机理研究
RS232接口具有传输和通信的作用,已成为嵌入式系统中单片机与外围设备之间的重要接口。由于RS232主要工作在通信协议的底层,因此保护RS232的基础结构非常重要。在测试中,通过耦合钳将脉冲双电磁拉入RS232数据传输线,模拟差模脉冲电压,根据测试数据得到RS232接口的损坏机理,同时给出了注入电压脉冲和端口接口损坏概率的Logistic模型,得到了RS232接口的性能评价。并对正常状态和损伤状态下的端口电压脉冲上下界范围进行了估计。
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