A review of advanced microscopy techniques for the development of nanotechnology in agriculture, food, and the environment

S. D. Gallegos-Cerda, J. Hernández-Varela, B. Arredondo-Tamayo, J. J. Chanona Pérez
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Abstract

Microscopy techniques are essential for understanding the structure of materials of interest in agriculture, food, and the environment. These techniques can be classified according to their operating principles, such as fluorescence, electron, and probe scanning. Their complementary techniques provide specific advantages in the characterization of materials in the above mentioned fields. These approaches facilitate the characterization of the structure and morphology at nanometric and atomic scales of different materials through high-resolution images, as well as the analysis of important characteristics related to the composition and distribution of specific components. In this work, detailed descriptions are given of the operation principles of light microscopy (LM), confocal laser scanning microscopy (CLSM), superresolution microscopy (SRM), scanning electron microscopy (SEM), atomic force microscopy (AFM), and transmission electron microscopy (TEM). A compilation of operating principles is presented along with examples obtained with advanced microscopy techniques applied to the afore mentioned areas. In addition, the preparation of the samples to obtain the final images is described in order to explain the interaction of the sample with the modes of operation for each technique. This review provides an overview of microscopy techniques used in various fields of nanotechnology, including agriculture, food, and the environment.
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农业、食品和环境领域纳米技术发展的先进显微技术综述
显微镜技术对于了解农业、食品和环境中感兴趣的材料结构至关重要。这些技术可以根据其工作原理进行分类,如荧光、电子和探针扫描。它们的互补技术在上述领域的材料表征方面提供了特定的优势。这些方法有助于通过高分辨率图像在纳米和原子尺度上表征不同材料的结构和形态,以及分析与特定成分的组成和分布相关的重要特征。本文详细介绍了光学显微镜(LM)、共聚焦激光扫描显微镜(CLSM)、超分辨率显微镜(SRM)、扫描电子显微镜(SEM)、原子力显微镜(AFM)和透射电子显微镜(TEM)的工作原理。操作原理的汇编,连同应用于上述领域的先进显微镜技术获得的例子一起提出。此外,描述了样品的制备以获得最终图像,以解释样品与每种技术的操作模式的相互作用。本文综述了纳米技术在农业、食品和环境等各个领域的应用。
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审稿时长
12 weeks
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