{"title":"A linear optimal test generation algorithm for interconnect testing","authors":"C. Su","doi":"10.1145/288548.288626","DOIUrl":null,"url":null,"abstract":"A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.","PeriodicalId":90518,"journal":{"name":"ICCAD. IEEE/ACM International Conference on Computer-Aided Design","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICCAD. IEEE/ACM International Conference on Computer-Aided Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/288548.288626","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.
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