Selective ion source for trace gas analysis

W. Genuit, Chen He-Neng , A.J.H. Boerboom, J. Los
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引用次数: 10

Abstract

An ion source is described in which molecules having an ionization potential less than 11.8 eV are selectively photoionized. It is shown that this method considerably improves the air contaminant detection limit of a standard quadrupole mass spectrometer and has great potential in the analysis of complex mixtures of trace gases.

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痕量气体分析的选择性离子源
描述了一种离子源,其中具有小于11.8 eV的电离势的分子被选择性地光解离。结果表明,该方法大大提高了标准四极杆质谱仪的空气污染物检测限,在复杂混合微量气体的分析中具有很大的应用潜力。
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Editorial Subject index Author index High resolution accurate mass measurements of FAB-generated ions by use of peak matching and multichannel analyzer techniques. Secondary ion mass spectrometry of low-temperature solids
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