{"title":"Tessellation Structured Illumination Microscopy","authors":"Doron Shterman, O. Eyal, S. Tsesses, G. Bartal","doi":"10.1364/cleo_at.2020.am2i.3","DOIUrl":null,"url":null,"abstract":"Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.","PeriodicalId":6719,"journal":{"name":"2020 Conference on Lasers and Electro-Optics (CLEO)","volume":"29 6 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Conference on Lasers and Electro-Optics (CLEO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/cleo_at.2020.am2i.3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.
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