The Effects of Alloying Elements on the Bonding Strength of Diamond/Carbide/Cu Interface Based on First‐Principles Calculations

Yujie Cao, Mao Wu, Yuan Fang, Ping Qian, Lin Zhang, X. Qu
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Abstract

The effects of different alloying elements (Ti, Zr) on the bonding strength of the diamond (111)/carbide (111)/Cu (111) interface system have been systematically investigated by means of first‐principles calculations based on density functional theory. It is found that the metal (Ti, Zr)‐terminated carbide is more likely to participate in the formation of the carbide (111)/Cu (111) and carbide (111)/diamond (111) interface. However, the C‐terminated carbide (111) interfaces have higher bonding strength compared with the metal (Ti, Zr)‐terminated carbide interfaces. In the Cu/carbide/diamond interface system, the bonding strength of carbide/Cu interface is lower than that of the carbide/diamond interface, which means the Cu/carbide/diamond interface failure first occurs in the carbide/Cu interface. According to the charge density, the stronger charge interaction between Zr and Cu causes higher bonding strength of ZrC/Cu interface compared with TiC/Cu interface. Therefore, the Cu/ZrC/diamond interface has higher bonding strength compared with the Cu/TiC/diamond interface. The Csp (carbide)–Csp (diamond) covalent bond and the metal (Ti3d, Zr4d)–Csp (diamond) covalent bond are formed at the diamond/carbide interface, while the Cu3d–Csp (carbide) covalent bond and the metal (Ti3d, Zr4d)–Cu3d metallic bond are formed at the Cu/carbide interface.
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基于第一性原理计算的合金元素对金刚石/碳化物/Cu界面结合强度的影响
采用基于密度泛函理论的第一性原理计算方法,系统研究了不同合金元素(Ti, Zr)对金刚石(111)/硬质合金(111)/Cu(111)界面体系结合强度的影响。结果表明,金属端部(Ti, Zr)的碳化物更有可能参与碳化物(111)/Cu(111)和碳化物(111)/金刚石(111)界面的形成。然而,端部为C的硬质合金(111)界面比端部为金属(Ti, Zr)的界面具有更高的结合强度。在Cu/硬质合金/金刚石界面体系中,硬质合金/Cu界面的结合强度低于硬质合金/金刚石界面,说明Cu/硬质合金/金刚石界面的破坏首先发生在硬质合金/Cu界面。从电荷密度来看,Zr与Cu之间更强的电荷相互作用使得ZrC/Cu界面的成键强度高于TiC/Cu界面。因此,Cu/ZrC/金刚石界面比Cu/TiC/金刚石界面具有更高的结合强度。Csp(碳化物)-Csp(金刚石)共价键和金属(Ti3d, Zr4d) -Csp(金刚石)共价键在金刚石/碳化物界面形成,Cu3d-Csp(碳化物)共价键和金属(Ti3d, Zr4d) -Cu3d金属键在Cu/碳化物界面形成。
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