{"title":"Study of the nanoscale electrical performance of NiO thin films by C-AFM and KPFM techniques: The effect of grain boundary barrier","authors":"Yidong Zhang, Junxiang Zuo, Pinjiang Li, Yuan-hao Gao, Weiwei He, Zhi Zheng","doi":"10.1016/J.PHYSE.2019.03.005","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20078,"journal":{"name":"Physica E: Low-dimensional Systems and Nanostructures","volume":"307 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physica E: Low-dimensional Systems and Nanostructures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/J.PHYSE.2019.03.005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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