Trapping/detrapping induced negative differential resistance in Cu/Ni:ZnO/InGa Schottky diode

N. Hamdaoui, F. B. Amor, A. Mezni, R. Ajjel
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Abstract

A Schottky diode based Cu/Ni:ZnO/InGa structure has been fabricated. The electrical characterization have highlighted the presence of negative differential resistance (NDR) effect and negative photoconductivity (NPC) in one device and at room temperature. The NDR effect can be explained in terms of trappings and detrapping of the mobile charges at the interface Cu/ Ni:ZnO. The main cause of the NPC effect is a combination between carriers injection by the external field and photocarriers due to UV illumination. As a result, these two features (NDR and NPC) lead to the optical switching effect in our device.
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Cu/Ni:ZnO/InGa肖特基二极管的捕获/去捕获诱导负差分电阻
制备了一种基于Cu/Ni:ZnO/InGa结构的肖特基二极管。电学表征强调了负差分电阻(NDR)效应和负光电导率(NPC)在一个器件和室温下的存在。NDR效应可以用Cu/ Ni:ZnO界面上移动电荷的诱捕和脱陷来解释。NPC效应的主要原因是外场注入的载流子与紫外光照射下的光载流子的结合。因此,这两个特性(NDR和NPC)导致了我们器件中的光交换效应。
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