Ji Wu, Xiao-xia Jia, Chang Liu, Hai-yan Yang, Chao Liu, Maozhong Jin
{"title":"A Statistical Model to Locate Faults at Input Level","authors":"Ji Wu, Xiao-xia Jia, Chang Liu, Hai-yan Yang, Chao Liu, Maozhong Jin","doi":"10.1109/ASE.2004.10008","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":90522,"journal":{"name":"IEEE/ACM International Conference on Automated Software Engineering workshops. IEEE/ACM International Conference on Automated Software Engineering","volume":"43 1","pages":"274-277"},"PeriodicalIF":0.0000,"publicationDate":"2004-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/ACM International Conference on Automated Software Engineering workshops. IEEE/ACM International Conference on Automated Software Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASE.2004.10008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}