Li Qingya, Gao Jin-chun, Xie Gang, Jin Qiuyan, J. Rui
{"title":"Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination","authors":"Li Qingya, Gao Jin-chun, Xie Gang, Jin Qiuyan, J. Rui","doi":"10.1016/S1005-8885(16)60059-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":67235,"journal":{"name":"","volume":"1 1","pages":"61-81"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"","FirstCategoryId":"95","ListUrlMain":"https://doi.org/10.1016/S1005-8885(16)60059-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}