{"title":"Experience in Virtual Testing of RSD cyclic A/D converters","authors":"M. Kubar, O. Subrt, P. Martínek, J. Jakovenko","doi":"10.1109/DDECS.2009.5012123","DOIUrl":null,"url":null,"abstract":"This paper deals with the ADC non-linearity extraction using a newly developed Virtual Testing Environment (VTE). The VTE proposed is built on Verilog-A implementation of the Servo-Loop unit fully integrated into Cadence design environment. The Servo-Loop method used is aimed at the nonlinearity extraction of static ADC transfer curve; in this paper, we prove an advanced Servo-Loop version focusing on behavioral and transistor-level example of the Residual Signed Digit (RSD) cyclic A/D converter design. Powerful capabilities of the proposed VTE were successfully confirmed by a large set of behavioral and transistor-level simulations in Spectre.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"202 1","pages":"178-181"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper deals with the ADC non-linearity extraction using a newly developed Virtual Testing Environment (VTE). The VTE proposed is built on Verilog-A implementation of the Servo-Loop unit fully integrated into Cadence design environment. The Servo-Loop method used is aimed at the nonlinearity extraction of static ADC transfer curve; in this paper, we prove an advanced Servo-Loop version focusing on behavioral and transistor-level example of the Residual Signed Digit (RSD) cyclic A/D converter design. Powerful capabilities of the proposed VTE were successfully confirmed by a large set of behavioral and transistor-level simulations in Spectre.