{"title":"Testing beyond the green light","authors":"Bob Klosterboer","doi":"10.1109/TEST.2017.8242025","DOIUrl":null,"url":null,"abstract":"This presentation will highlight some of the challenges and opportunities that test developers and test operations managers face in a changing data climate. Measured data will drive decisions not only about the product under test, but potentially on the entire design and manufacturing ecosystem. I will also explore some of the value tradeoffs of increased data harvesting vs. reduced test cost requirements of each component.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2017.8242025","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This presentation will highlight some of the challenges and opportunities that test developers and test operations managers face in a changing data climate. Measured data will drive decisions not only about the product under test, but potentially on the entire design and manufacturing ecosystem. I will also explore some of the value tradeoffs of increased data harvesting vs. reduced test cost requirements of each component.
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