{"title":"Investigation of sensibility of temperature response on selected parameters of multilayer structure","authors":"Z. Suszyński, P. Majchrzak, L. Majchrzak","doi":"10.1051/JP4:2006137067","DOIUrl":null,"url":null,"abstract":"In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.","PeriodicalId":14838,"journal":{"name":"Journal De Physique Iv","volume":"27 1","pages":"353-356"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal De Physique Iv","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1051/JP4:2006137067","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.
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